Presenter: Myles Glisson, Sr Staff Applications Engineer, Synopsys Inc.

Abstract: In the rapidly evolving landscape of electronic design and verification, the integration of Artificial Intelligence (AI) has emerged as a transformative force. This tutorial covers the next-generation AI technologies, including machine learning, that reshape coverage optimization and debugging automation. Attendees will gain valuable insights into practical AI applications for verification, with examples, enabling verification engineers to harness AI’s power to overcome manual, time-consuming steps. Technologies and methodologies covered include a system to launch AI-based coverage and regression debug automation from binning to root cause analysis. Overall, this AI-driven approach offers high coverage, as well as fast and accurate root cause identification.